Probecard testers

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Yield problems and inconsistent test results? The probe card is a crucial part of a wafer test set-up. The probe card is the mechanical interface between the test system and the bond pads on the wafer. Probe tip misalignment, high contact resistance, and signal leakage will cause inconsistent test results and/or even rejects. Eliminate this variable by using the Supervisor IV to analyze and manage the probe-card physical and electrical condition.


Probecard tester tools4 Products
Other products3 Products
Probecard testers5 Products