MANAGER

Probecard testers

| V




DESCRIPTION

Nowadays, more complex probe cards are being used. More pins, a higher density and a larger array require a new approach in probe card analysis. With the soaring costs of new generation probe cards, repair of defective cards becomes a necessity. BE Precision Technology offers all capabilities with the new MANAGER V. Future proof, up to 450 mm full wafer contact probe cards can be analysed, with up to 88.000 test channels. High-end materials are used to stand extra tough requirements— such as a 500 mm diameter diamante viewing window, ultra-stiff carbon flip-table, or high power Z–stage to generate 600 Kg of contact force.




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