MANAGER

Probecard testers

| V




DESCRIPTION

Today more complex probe cards are being used. More pins, higher density and larger array requires a new approach in probe card analysis. With the soaring cost of new generation probe cards, repair of defective cards becomes an necessity. BE Precision Technology offers all capabilities with the new MANAGER V. Future proof, up to 450 mm full wafer contact probe cards can be analyzed with up to 88.000 test channels. High-end materials are used to stand extra tough requirements— such as 500 mm diameter diamante viewing window, ultra stiff carbon flip-table, high power Z–stage to generate 600 Kg of contact force




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