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The probe-card is a crucial part of a wafer test set-up and is the mechanical interface between a test system and the bond-pads on the wafer. Probe-tip misalignment, high contact resistance, signal leakage will cause inconsistent test results and/or even rejects. Eliminate this variable by checking and managing the probe-card physical and electrical condition. The Manager V informs you quick and accurate on the condition of your probe-cards.

A physical check of the probe-tip locations in    3-D (X/Y/Z) will generate a detailed status report and necessary repair instructions. Electrical verification informs you about the contact resistance throughout the entire probe-card all the way to the probe-tip as well as the leakage between the probe-tips and their connections. 

Our product portfolio consists of 6 products: Supervisor IV, Manager III, Manager V, 3D profiler, Scrubmark analyzer, OS tester.

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Probecard testers5 Products
Probecard tester tools4 Products
Other products4 Products

Most popular products

PRVX Upgrades

PRVX - New computer system with Windows 10 and BE software - Expandable to 9,000 channels - Obsolete electronics...

Supervisor V

Yield problems and inconsistent test results? The probe card is a crucial part of a wafer test set-up. The probe card i...

Manager IV

- System for small probecards with small pincount and small probe area - Depending on the model 750 to 4500 channels...

Manager V

Today more complex probe cards are being used. More pins, higher density and larger array requires a new approach in p...

Inspector 3D Analyser

The INSPECTOR is able to show probe tip wear of the tip shape and will also show how much the probe has moved verticall...

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